11 results
A Multiscale, Correlative, Air Free Workflow for the Analysis of Li Distribution in Batteries via ToF-SIMS
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 866-867
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- August 2022
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Correlated XRM and 3D FIB-SEM Workflow to Investigate the Structure-Property Relationship of Si-Based Battery Anode Materials
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 198-199
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- August 2022
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Femto-second laser applications in energy materials characterization
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2456-2457
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- August 2021
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STEM-tomography in SEM
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1060-1061
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- August 2021
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Save your FIB from the hard work – Large-scale sample prep using a LaserFIB
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 18-19
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- August 2021
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A new beam alignment method in SEM based on parallax principle
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1612-1613
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- August 2021
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Novel nuclear materials characterization workflows enabled by fs-laser milling
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 3086-3087
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- August 2021
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LaserFIB – the New All-in-one Tool to Speed up Sample Preparation for APT
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1978-1979
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- August 2020
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Achieving Nanoscale EDS Analysis in Transmission Scanning Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 514-515
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- August 2020
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Increasing the Stability and Quality of High-resolution FIB-SEM Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 896-897
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- August 2020
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From Photons to Electrons - A Correlative Workflow for Analysis and Preparation of Embedded Samples Using the LaserFIB
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 380-381
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- August 2020
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